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DRAM Module Testing Flow

ATE Testing
(Chip)

•Open short

•ICC Measure, Leakage

•AC Function

•Hynix, Samsung, Micron, Spectek

•High Temp : -25~85℃

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SMT

•Open Short

MB Testing
(End Product)

•Single/ Dual Channel

•Memtest, Pass mark, CPU-Z

•Compatibility Testing

•ASUS, MSI, Gigabyte, Asrock

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 ATE Testing (Optional)

•Open short

•ICC Measure, Leakage

•AC Function

•Customize testing

SSD Testing flow

ATE Testing

(Optional)

•ATE, Pin/Power Short, Leakage

•Icc, Power Consumption Test

•High Temp

•Customization Test

RDT Testing (Chip)

•SMI、Asolid Controller

•Open Card

•Reliability Testing

•High Temp: 70°C

SMT

RDT Testing (End Product)

•Open Card

•Reliability Testing

•High Temp: 70°C

BIT Testing (End Product)

•Burn in test

•Pass mark

•High Temp: 70°C

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