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DRAM Module Testing Flow
ATE Testing
(Chip)
•Open short
•ICC Measure, Leakage
•AC Function
•Hynix, Samsung, Micron, Spectek
•High Temp : -25~85℃
SMT
•Open Short
MB Testing
(End Product)
•Single/ Dual Channel
•Memtest, Pass mark, CPU-Z
•Compatibility Testing
•ASUS, MSI, Gigabyte, Asrock
ATE Testing (Optional)
•Open short
•ICC Measure, Leakage
•AC Function
•Customize testing
SSD Testing flow
ATE Testing
(Optional)
•ATE, Pin/Power Short, Leakage
•Icc, Power Consumption Test
•High Temp
•Customization Test
RDT Testing (Chip)
•SMI、Asolid Controller
•Open Card
•Reliability Testing
•High Temp: 70°C
SMT
RDT Testing (End Product)
•Open Card
•Reliability Testing
•High Temp: 70°C
BIT Testing (End Product)
•Burn in test
•Pass mark
•High Temp: 70°C
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