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DRAM Module Testing Flow

IC Sorting
(ATE)

•Pin/Power Short

•Idd/Icc testing​​, Leakage Test

•Hynix, Samsung, Micron

•High and low temp test : -25~85℃

•Corner Function Test

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SMT

•Open/Short Test

 MB Testing
(SLT)

•Single/Dual Channel

•Memtest

•Guard band Testing

•Compatibility Testing

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  ATE Testing      (Optional)

•Pin/Power Short, Leakage,

•Idd/Icc testing
•Customized procedure for testing

SSD Testing flow

ATE Testing

(Optional)

•ATE, Pin/Power Short, Leakage

•Icc, Power Consumption Test

•High Temp

•Customization Test

RDT Testing (Chip)

•SMI、Asolid Controller

•Open Card

•Reliability Testing

•High Temp: 70°C

SMT

RDT Testing (End Product)

•Open Card

•Reliability Testing

•High Temp: 70°C

BIT Testing (End Product)

•Burn in test

•Pass mark

•High Temp: 70°C

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