IC Sorting
(ATE)

•Pin/Power Short

•Idd/Icc testing, Leakage Test

•Hynix, Samsung, Micron

•High and low temp test : -25~85℃

•Corner Function Test

SMT

•Open/Short Test

•Single/Dual Channel

•Memtest

•Guard band Testing

•Compatibility Testing

•Pin/Power Short, Leakage,

•Idd/Icc testing
•Customized procedure for testing

ATE Testing

(Optional)

•ATE, Pin/Power Short, Leakage

•Icc, Power Consumption Test

•High Temp

•Customization Test

RDT Testing (Chip)

•SMI、Asolid Controller

•Open Card

•Reliability Testing

•High Temp: 70°C

SMT

RDT Testing (End Product)

•Open Card

•Reliability Testing

•High Temp: 70°C

BIT Testing (End Product)

•Burn in test

•Pass mark

•High Temp: 70°C